The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Mar. 15, 2012
Applicant:

Tsan Lin Chen, Zhubei, TW;

Inventor:

Tsan Lin Chen, Zhubei, TW;

Assignee:

HGST TECHNOLOGIES SANTA ANA, INC., Santa Ana, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 16/34 (2006.01); H04L 12/26 (2006.01); G11C 29/04 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 16/349 (2013.01); G11C 29/82 (2013.01); G11C 2029/0409 (2013.01); G11C 2029/4402 (2013.01); H04L 43/0847 (2013.01);
Abstract

In one aspect, the present disclosure provides a storage device for accounting for transmission errors to improve a usable life span of memory blocks. In some embodiments, the storage device includes: a memory array including a plurality of memory blocks; and a memory controller in communication with the memory array via an interface, wherein the memory controller is configured to detect an error event associated with data from one of the plurality of memory blocks; determine an origin of the error event; increment an error count if the origin of the error event indicates a data error in the one of the plurality of memory blocks and not if the origin of the error event indicates a transmission error; compare the error count to a threshold value; and mark the one of the plurality of memory blocks as bad when the error count exceeds the threshold value.


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