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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9542768 B1

PDFFull Text
Date of Patent:
Jan. 10, 2017

Filed:

Aug. 28, 2015

Apparatus, method, and program for processing 3d microparticle data

Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Shunsuke Suzuki, Kanagawa, JP;

Atsuo Fujimaki, Tokyo, JP;

Kenji Shoda, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:

K&L Gates LLP

Primary Examiner:

Jacinta M Crawford

Assistant Examiner:

Jonathan M Cofino

Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 11/20 (2006.01); G01N 15/14 (2006.01); G06T 3/40 (2006.01); G06T 3/60 (2006.01); H04N 13/02 (2006.01); H04N 13/04 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G06T 15/00 (2013.01); G01N 15/14 (2013.01); G06T 3/40 (2013.01); G06T 3/60 (2013.01); G06T 11/206 (2013.01); H04N 13/0203 (2013.01); H04N 13/0275 (2013.01); H04N 13/0282 (2013.01); H04N 13/0409 (2013.01); H04N 13/0436 (2013.01); H04N 13/0447 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1477 (2013.01); G06T 2200/04 (2013.01); G06T 2200/08 (2013.01); G06T 2210/56 (2013.01);
Abstract

An information processing apparatus for 3D microparticle data analysis is provided. The information processing apparatus includes a data storage unit configured to store measurement data of microparticles; a data processing unit configured to create a 3D image in a coordinate space with three types of variables from the measurement data, the 3D image represents a characteristic distribution of the microparticles; and a display unit configured to display the 3D image, wherein in a case that a gating region is set in the 3D image, the 3D image is rotated or scaled up or down along with the gating region on the display unit. An information processing method and program for 3D microparticle data analysis are also provided.

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