The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Apr. 22, 2015
Berkin Bilgic, Boston, MA (US);
Kawin Setsompop, Charlestown, MA (US);
Berkin Bilgic, Boston, MA (US);
Kawin Setsompop, Charlestown, MA (US);
The General Hospital Corporation, Boston, MA (US);
Abstract
Described here are systems and methods for quantitative susceptibility mapping ('QSM') using magnetic resonance imaging ('MRI'). Susceptibility maps are reconstructed from phase images using an automatic regularization technique based in part on variable splitting. Two different regularization parameters are used, one, λ, that controls the smoothness of the final susceptibility map and one, μ, that controls the convergence speed of the reconstruction. For instance, the regularization parameters can be determined using an L-curve heuristic to find the parameters that yield the maximum curvature on the L-curve. The μ parameter can be determined based on an l-regularization and the λ parameter can be determined based on the iterative l-regularization used to reconstruct the susceptibility map.