The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Jan. 30, 2014
Applicants:
Ivana To{hacek Over (S)}ić, Berkeley, CA (US);
Jae Young Park, Houston, TX (US);
Kathrin Berkner, Los Altos, CA (US);
Inventors:
Ivana To{hacek over (s)}ić, Berkeley, CA (US);
Jae Young Park, Houston, TX (US);
Kathrin Berkner, Los Altos, CA (US);
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 7/00 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/002 (2013.01); G06T 7/0018 (2013.01); H04N 13/0232 (2013.01); H04N 17/002 (2013.01);
Abstract
The pupil image function (PIF) matrix of a plenoptic imaging system is calibrated, taking advantage of the low rank of the PIF matrix. In one approach, the low rank is utilized by identifying a subspace for the PIF matrix and then estimating the PIF matrix within that subspace. This can lead to a significant reduction in the number of calibration patterns used to estimate the PIF matrix.