The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Jun. 14, 2013
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Jeffrey Ira Cohen, Sunnyvale, CA (US);
Kurt Harriman, Novato, CA (US);
Matthew Clark McCline, Seattle, WA (US);
Assignee:
EMC Corporation, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30404 (2013.01); G06F 17/30359 (2013.01); G06F 17/30362 (2013.01);
Abstract
A CaQL API is provided by receiving a query directed to a catalog that includes metadata. A catalog access target is determined based at least in part on one or more of the following: a CaQL keyword which is included in the query, a name of a table in the catalog which is included in the query, or a predicate which is included in the query. A catalog function is generated based at least in part on the CaQL keyword and the catalog function is performed on the catalog access target.