The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Aug. 16, 2013
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventors:

Joseph M. Gorin, Santa Rosa, CA (US);

Michael E. Barnard, Windsor, CA (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/14 (2006.01);
U.S. Cl.
CPC ...
G06F 17/142 (2013.01);
Abstract

An electromagnetic interference (EMI) signal is processed by digitizing the EMI signal, generating a plurality of overlapping time records from the digitized EMI signal, applying a window function to the plurality of overlapping time records to produce a plurality of modified time records, wherein the window function has a substantially flat top, and performing a fast Fourier transform (FFT) on each of the modified time records to produce a plurality of corresponding amplitude envelopes.


Find Patent Forward Citations

Gorin, Joseph. (2017). Overlapped fast fourier transform based measurements using flat-in-time windowing (U.S. Patent No. 9542358). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9542358

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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