The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Aug. 19, 2013
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Yang Lei, Cary, NC (US);
Xiaoqiao Meng, Yorktown Heights, NY (US);
Jian Tan, Wappingers Falls, NY (US);
Li Zhang, Yorktown Heights, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/50 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3447 (2013.01); G06F 9/50 (2013.01); G06F 9/5061 (2013.01); G06F 11/3442 (2013.01); G06F 11/3409 (2013.01);
Abstract
Inducing perturbation by varying a supply amount of the resource type in the system and measuring performance of the software entity at multiple variation levels of the supply amount of the resource type in the system. A model may be built that characterizes a relationship between the measured performance and the variation levels. The model may be applied to detect the resource bottleneck. The model may be also applied for capacity planning.