The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Sep. 17, 2014
Emc Corporation, Hopkinton, MA (US);
Yu Fu, Shanghai, CN;
Chao Chen, Shanghai, CN;
Tianqing Wang, Shanghai, CN;
Qianjie Zhong, Shanghai, CN;
Qiyan Chen, Shanghai, CN;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
The present disclosure relates to a method and apparatus for troubleshooting based on log similarity. In one embodiment, there is provided a method for troubleshooting based on log similarity, comprising: extracting log patterns from multiple log files in response to having collected the multiple log files from at least one system with troubles, the log pattern describing a regular expression to which a log message in a log file among the multiple log files conforms; building a pattern repository using the log patterns; mapping each of the multiple log files to an n-dimensional vector based on the pattern repository; and clustering multiple n-dimensional vectors to which each of the multiple log files is mapped into at least one group, wherein each of the at least one group indicates one trouble type of the at least one system. In another embodiment, there is provided a corresponding apparatus.