The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9542252 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 10, 2017

Filed:

Sep. 17, 2014
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Tetsuya Uchiumi, Kawasaki, JP;

Yasuhide Matsumoto, Kawasaki, JP;

Shinji Kikuchi, Yokohama, JP;

Shinya Kitajima, Inagi, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 9/445 (2006.01); G06F 11/30 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 9/445 (2013.01); G06F 9/44505 (2013.01); G06F 11/0709 (2013.01); G06F 11/0754 (2013.01); G06F 11/3051 (2013.01); H04L 41/0869 (2013.01);
Abstract

An information processing method for supporting data setting include: extracting a first feature value for each of plural parameters from first data that is data after at least one parameter value, which is included in second data that includes, for each of plural setting targets, each parameter value for each of the plural parameters, was changed; and extracting a parameter that is a candidate of an erroneously changed parameter based on a difference between a second feature value that is extracted, for each of the plural parameters, from the second data and a corresponding first feature value.


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