The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Dec. 10, 2014
Applicant:

Microchip Technology Incorporated, Chandler, AZ (US);

Inventors:

Burke Davison, Chandler, AZ (US);

Xiang Gao, Chandler, AZ (US);

Yann LeFaou, Chandler, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/044 (2006.01); H03K 17/96 (2006.01);
U.S. Cl.
CPC ...
G06F 3/044 (2013.01); H03K 17/962 (2013.01); H03K 2017/9606 (2013.01); H03K 2017/9613 (2013.01); H03K 2217/960705 (2013.01); H03K 2217/960725 (2013.01); H03K 2217/960765 (2013.01); H03K 2217/960775 (2013.01);
Abstract

In a method for performing a touch determination with a capacitive sensor, a self capacitance measurement of a capacitive sensor is initiated, wherein at the same time a mutual capacitance measurement including the capacitive sensor is performed. Such a method can be performed such that the self capacitance measurement and the mutual capacitance measurement differentially cancel with ungrounded conductive objects approaching or touching the capacitive sensor and additively combine for grounded objects approaching or touching the capacitive sensor.


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