The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Aug. 29, 2013
Raytheon Bbn Technologies Corp., Cambridge, MA (US);
Zachary R. Hoffman, Huntington Station, NY (US);
Charles DiMarzio, Cambridge, MA (US);
Raytheon BBN Technologies Corp., Cambridge, MA (US);
Abstract
An optical imaging system and method for performing random intensity illumination microscopy is disclosed. The system includes an incoherent signal light source, at least two diffusers having spatially random diffusion patterns, an image capture device that receives a reflected light signal from an object to be imaged, and a processor configured to perform digital image processing of the reflected signal. The method comprises acts of providing an incoherent light signal, diffusing the incoherent light signal with at least two diffusers having spatially random diffusion patterns to provide a diffused light signal, splitting the diffused light signal to provide a first light signal and a second light signal, reflecting the first light signal from a specimen to provide a reflected light signal, collecting the reflected light signal and the second light signal with an image capture device and processing the collected images to determine reflectance.