The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Aug. 14, 2013
Applicant:

Carl Zeiss Meditec Ag, Jena, DE;

Inventors:

Fenny Nauli, Oberkochen, DE;

Reinhold Pfeiffer, Donauwoerth, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/02 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0012 (2013.01); G02B 21/02 (2013.01);
Abstract

A surgical microscope objective has an adjustable focal intercept and defines an optical axis. The objective has an objective body wherein a negative member is fixed and in which a positive member can be displaced. The negative member faces toward the object and has a lateral edge. The positive member is held in a frame, which is guided on a first guiding section formed on the objective body so it can move in the direction of the optical axis using a first guiding part. The positive member is guided on a second guiding section, which is formed on the objective body, using a second guiding part connected to the frame of the positive member and movable between the lateral edge of the negative member and the objective body. The second guiding part is offset from the first guiding part in the direction of the optical axis facing the negative member.


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