The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Aug. 14, 2013
Applicant:

Avx Corporation, Fountain Inn, SC (US);

Inventors:

William A. Millman, Paignton, GB;

Marc V. Beaulieu, Gray, ME (US);

Michael I. Miller, Hollis Center, ME (US);

Mark W. Leinonen, Scarborough, ME (US);

Assignee:

AVX Corporation, Fountain Inn, SC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 37/00 (2006.01); G01R 31/36 (2006.01); G01R 31/01 (2006.01); G01R 31/28 (2006.01); H01L 49/02 (2006.01); G01R 31/02 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G01R 31/36 (2013.01); G01R 31/016 (2013.01); G01R 31/028 (2013.01); G01R 31/02 (2013.01); G01R 31/2855 (2013.01); H01L 22/00 (2013.01); H01L 28/00 (2013.01);
Abstract

A method of iteratively screening a sample of electrolytic capacitors having a predetermined rated voltage is provided. The method can include measuring a first leakage current of a first set of capacitors, calculating a first mean leakage current therefrom, and removing capacitors from the first set having a first leakage current equal to or above a first predetermined value, thereby forming a second set of capacitors. The second set can be subjected to a burn in heat treatment where a test voltage can be applied, then a second leakage current of the second set of capacitors can be measured and a second mean leakage current can be calculated. Capacitors having a second leakage current equal to or above a second predetermined value can be removed from the second set, forming a third set of capacitors. Because of such iterative screening, the capacitors in the third set have low failure rates.


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