The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Oct. 27, 2014
Applicant:
Fluke Corporation, Everett, WA (US);
Inventor:
Paul Andrew Ringsrud, Langley, WA (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01R 15/20 (2006.01); G01R 19/00 (2006.01); G01R 15/12 (2006.01);
U.S. Cl.
CPC ...
G01R 15/202 (2013.01); G01R 15/205 (2013.01); G01R 15/207 (2013.01); G01R 19/0092 (2013.01); G01R 15/12 (2013.01);
Abstract
Apparatus and methods for measuring current flowing through a conductor include a device comprised of a magnetically conductive loop having a plurality of strands and a magnetic field sensor. Each strand has a magnetically conductive material. The strands are configured to pass a magnetic field to a first magnetic field sensor that is positioned adjacent to an end of the first plurality of strands. The plurality of strands may be arranged in various patterns that allow the magnetically conductive loop to be more bendable or flexible than a current-clamp device.