The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Oct. 04, 2013
Applicant:

United Technologies Corporation, Hartford, CT (US);

Inventors:

Jeffrey Denton, Jackson, MI (US);

James H. Stewart, Holt, MI (US);

William Bogue, Hebron, CT (US);

Assignee:

United Technologies Corporation, Farmington, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/44 (2006.01); G01N 21/25 (2006.01); G01N 21/3563 (2014.01);
U.S. Cl.
CPC ...
G01N 33/44 (2013.01); G01N 21/25 (2013.01); G01N 21/3563 (2013.01); Y10T 29/49769 (2015.01);
Abstract

A non-destructive method for determining an amount of temperature exposure to a Bismaleimide Resin (BMI) matrix substrate, the method includes determining component data of a Bismaleimide Resin (BMI) matrix component via fourier transform infrared (FTIR) spectroscopy; correlating the component data to model data to determine a structural debit from temperature exposure; and bounding a structurally damaged area in response to the correlating.


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