The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Jan. 17, 2013
Xuefei Guan, Princeton, NJ (US);
Hui Zhen, Zhangjiajie, CN;
Jingdan Zhang, Plainsboro, NJ (US);
Shaohua Kevin Zhou, Plainsboro, NJ (US);
Ashley L. Lewis, Oviedo, FL (US);
Steve H. Radke, Orlando, FL (US);
Chin-sheng Lee, Winter Springs, FL (US);
Xuefei Guan, Princeton, NJ (US);
Hui Zhen, Zhangjiajie, CN;
Jingdan Zhang, Plainsboro, NJ (US);
Shaohua Kevin Zhou, Plainsboro, NJ (US);
Ashley L. Lewis, Oviedo, FL (US);
Steve H. Radke, Orlando, FL (US);
Chin-Sheng Lee, Winter Springs, FL (US);
Siemens Energy, Inc., Orlando, FL (US);
Abstract
A method of fatigue life prediction including: calculating a critical crack size of an object of interest; identifying a first flaw in ultrasound data of the object of interest; determining that the first flaw interacts with a second flaw, the first flaw is to be merged with the second flaw, or the first flaw is isolated; calculating an initial crack size based on the determination; and calculating an increase in the initial crack size due to fatigue and creep to determine a number of load cycles until the initial crack size reaches the critical crack size.