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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9541529 B1

PDFFull Text
Date of Patent:
Jan. 10, 2017

Filed:

Oct. 08, 2014

Ultrasonic probe for examining an object with ultrasound and corresponding examination method

Applicant:

Areva NP, Courbevoie, FR;

Inventors:

Matthieu Taglione, Dijon, FR;

Yannick Caulier, Chalon sur Saone, FR;

Assignee:

AREVA NP, Courbevoie, FR;

Attorney:

Davidson, Davidson & Kappel, LLC

Primary Examiner:

Harshad R Patel

Assistant Examiner:

Samir M Shah

Int. Cl.
CPC ...
G01B 17/02 (2006.01); G01N 29/24 (2006.01); G01B 21/20 (2006.01); G01N 29/26 (2006.01); G01N 21/88 (2006.01); G01B 17/06 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01N 29/2418 (2013.01); G01B 11/24 (2013.01); G01B 17/06 (2013.01); G01B 21/20 (2013.01); G01N 21/8803 (2013.01); G01N 29/262 (2013.01); G01N 2291/028 (2013.01); G01N 2291/106 (2013.01);
Abstract

An ultrasonic probe for examining an object with ultrasound and a corresponding examination method are provided. The probe includes a plurality of emitter elements able to emit ultrasonic waves for emitting a focused ultrasonic beam into the object through an active area of a surface of the object, and a profilometer for determining the profile of the surface of the object and for controlling the emission of the ultrasonic beam depending on the determined profile. The profilometer includes an image-taking apparatus for taking at least one digital image of the active area and an image processing module able to determine the profile of the active area by analyzing the optical blurring of the or at least one image.

Find Patent Forward Citations

Taglione, Matthieu. (2017). Ultrasonic probe for examining an object with ultrasound and corresponding examination method (U.S. Patent No. 9541529). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9541529

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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