The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Dec. 15, 2015
Applicant:

Lam Research Corporation, Fremont, CA (US);

Inventor:

Roger Patrick, Mountain View, CA (US);

Assignee:

I AM RESEARCH CORPORATION, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); G01N 27/20 (2006.01); G01N 17/00 (2006.01); C23C 16/50 (2006.01); G01N 17/04 (2006.01);
U.S. Cl.
CPC ...
G01N 27/20 (2013.01); C23C 16/50 (2013.01); G01N 17/00 (2013.01); G01N 17/04 (2013.01); Y10T 29/49004 (2015.01);
Abstract

Apparatus and methods for diagnosing status of a consumable part of a plasma reaction chamber, the consumable part including at least one conductive element embedded therein. The method includes the steps of: coupling the conductive element to a power supply so that a bias potential relative to the ground is applied to the conductive element; exposing the consumable part to plasma erosion until the conductive element draws a current from the plasma upon exposure of the conductive element to the plasma; measuring the current; and evaluating a degree of erosion of the consumable part due to the plasma based on the measured current.


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