The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Jun. 13, 2012
Ronald Walsworth, Newton, MA (US);
Jeff Lichtman, Cambridge, MA (US);
Narayanan Kasthuri, Cambridge, MA (US);
David Glenn, Cambridge, MA (US);
Huiliang Zhang, Cambridge, MA (US);
Richard Schalek, Wakefield, MA (US);
Ronald Walsworth, Newton, MA (US);
Jeff Lichtman, Cambridge, MA (US);
Narayanan Kasthuri, Cambridge, MA (US);
David Glenn, Cambridge, MA (US);
Huiliang Zhang, Cambridge, MA (US);
Richard Schalek, Wakefield, MA (US);
PRESIDENT AND FELLOWS OF HARVARD COLLEGE, Cambridge, MA (US);
Abstract
Multi-color CL images of nanoparticle samples may be generated, by irradiating with a scanning electron beam a nanoparticle sample that containing a plurality of spectrally distinct optical emitters configured to generate CL light at respective different color channels, then detecting the CL light from the nanoparticles to generate multi-color NP-CL images of the nanoparticle sample. In some embodiments, SE (secondary electron) images of the sample may be acquire, substantially simultaneously with the acquisition of the CL images, so as to generate correlative NP-CL and SE images of the nanoparticle sample. In some embodiments, the nanoparticles may be surface-functionalized so that the nanoparticles selectively bind only to particular structures of interest.