The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Mar. 07, 2014
Dainippon Screen Mfg. Co., Ltd., Kyoto-shi, Kyoto, JP;
Osaka University, Suita-shi, Osaka, JP;
Hidetoshi Nakanishi, Kyoto, JP;
Akira Ito, Kyoto, JP;
Masayoshi Tonouchi, Suita, JP;
Iwao Kawayama, Suita, JP;
SCREEN HOLDINGS CO., LTD., Kyoto, JP;
OSAKA UNIVERSITY, Osaka, JP;
Abstract
An inspecting device includes: an irradiation part for dividing pulsed light emitted from a femtosecond laser into measurement pump light and measurement probe light, to irradiate a solar cell; a detection part for detecting an electromagnetic wave emitted from the solar cell in accordance with the irradiation with the measurement probe light; and a measurement delay part for delaying the time of arrival of the measurement probe light at the solar cell relatively to the measurement pump light. The irradiation part is provided with a galvano mirror for scanning with the measurement probe light a wide range which is wider than an irradiated range (pump light spot) being irradiated with the measurement pump light in a solar cell.