The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Jul. 06, 2011
Ken Tsukii, Tokyo, JP;
Toru Takahashi, Tokyo, JP;
Jie Xu, Tokyo, JP;
FURUKAWA ELECTRIC CO., LTD., Tokyo, JP;
Abstract
The invention provides an optical measuring apparatus having a plurality of measuring sections each having a light irradiating section for irradiating light to specimens and a light receiving section for receiving optical data acquired by irradiating the light to the specimens and a flow rate calculating section for calculating flow rate values of the specimens based on a difference of measured times of the optical data measured by the plurality of measuring sections with respect to the specimens and a distance between the plurality of measuring sections. The optical measuring apparatus measures the optical data of the specimens by irradiating light to the specimens, i.e., the objects to be measured, dispersed within a sample fluid flowing through a flow passage. The optical measuring apparatus further includes a flow rate graph generating section for generating flow rate graph data in which the values of flow rate of the specimens calculated by the flow rate calculating section are arrayed in order of calculation in time-series manner and for outputting the generated flow rate graph data to a displaying section.