The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Sep. 19, 2013
Applicant:
Msp Corporation, Shoreview, MN (US);
Inventors:
Benjamin Y. H. Liu, North Oaks, MN (US);
Virgil A. Marple, Maple Plain, MN (US);
Francisco Romay, Vadnais Heights, MN (US);
Lin Li, Shoreview, MN (US);
Assignee:
MSP CORPORATION, Shoreview, MN (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 1/22 (2006.01); G01N 5/02 (2006.01);
U.S. Cl.
CPC ...
G01N 15/06 (2013.01); G01N 1/2205 (2013.01); G01N 5/02 (2013.01); G01N 15/0606 (2013.01);
Abstract
An apparatus and method for sampling and measuring air born particulate matter includes an inlet for the particulate containing gas to enter. A mechanism then removes coarse particles larger than a selected size while permitting filtered particles of less than the selected size to pass through. A chamber containing a quartz crystal sensor permits the filtered particles that have passed through to deposit to create an output signal in response to the deposited particle mass.