The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Mar. 14, 2014
Fluke Corporation, Everett, WA (US);
John Neeley, Seattle, WA (US);
Bradey Honsinger, Everett, WA (US);
Tyler Bennett Evans, Edmonds, WA (US);
Joseph V. Ferrante, Redmond, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
A method and system for comparing measurements of a device under test (DUT) to measurements taken of similar equipment are provided. The method includes communicatively connecting a mobile computing device to one or more measurement devices, and receiving measurement data from the one or more measurement devices. The mobile computing device determines an equipment identifier of the DUT, and retrieves information associated with the equipment, which may include previous measurements of other devices or reference documents. The mobile computing device presents the retrieved information along with the received measurement data for comparison.