The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Oct. 15, 2013
Applicant:

Leica Geosystems Ag, Heerbrugg, CH;

Inventor:

Damien Dusha, Dutton Park, AU;

Assignee:

LEICA GEOSYSTEMS AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01); G01C 15/06 (2006.01); G01C 21/16 (2006.01);
U.S. Cl.
CPC ...
G01C 15/06 (2013.01); G01C 21/16 (2013.01); G01C 21/165 (2013.01);
Abstract

Surveying system for measuring the position of a measuring point on the ground is disclosed. The surveying system may include a survey pole with a body having a pointer tip for contacting the measuring point and position giving means for making available the coordinative determination of a referenced position, being placed on the body with a defined spatial relationship relative to the tip. Determination means may be included for repeatedly determining the referenced position of the position giving means. Evaluation means may also be included for deriving the position of the measuring point. In some embodiments, the survey pole may also include an inertial measuring unit placed on the body with a defined spatial relationship relative to the position giving means.


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