The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Dec. 14, 2012
Applicant:

Microsoft Corporation, Redmond, WA (US);

Inventors:

Sriram Sankar, Redmond, WA (US);

Brandon Rubenstein, Lynnwood, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
F24F 11/00 (2006.01); H05K 7/20 (2006.01);
U.S. Cl.
CPC ...
F24F 11/0079 (2013.01); H05K 7/20836 (2013.01); F24F 2011/0063 (2013.01); Y02B 30/746 (2013.01);
Abstract

Climate regulation within an enclosure (e.g., a server cabinet) may involve a climate regulator device that reports a set of available settings (e.g., fan speeds of a fan array) to a computational unit that selects among the available settings. However, such techniques involve bidirectional communication between the climate regulator device and a computational unit that is capable of utilizing the device-specific settings. Presented herein are climate regulation architectures involving a request from the computational unit as a climate target that is independent of the settings of the climate regulator devices (e.g., an selection on an arbitrary scale from 0 to 100). A climate regulator controller may map the device-independent climate target to a selection among the available settings of the particular climate regulator device(s). Further variations may involve conflict resolution among requests from different computational sub-units, and/or failsafe mechanisms such as default climate regulator device settings to alleviate controller failure.


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