The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Mar. 19, 2014
Applicant:

Kimberly-clark Worldwide, Inc., Neenah, WI (US);

Inventors:

Brett Schoenberg, Evans, GA (US);

Mark Gary Dollevoet, Freedom, WI (US);

Jeffrey George Skarda, Appleton, WI (US);

Matthew Robert Wilson, Oshkosh, WI (US);

Kevin B. Sartain, Evans, GA (US);

Gregory Michael Bixler, Appleton, WI (US);

Daniel Mark Heinz, Greenville, WI (US);

Vivek Moreshwar Karandikar, Neenah, WI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 26/02 (2006.01); G01N 33/34 (2006.01); B65H 18/08 (2006.01);
U.S. Cl.
CPC ...
B65H 26/02 (2013.01); B65H 18/08 (2013.01); G01N 33/346 (2013.01); B65H 2511/40 (2013.01); B65H 2511/52 (2013.01); B65H 2553/822 (2013.01); B65H 2557/62 (2013.01); G01N 2203/0278 (2013.01);
Abstract

Registration and inspection systems and methods for use on a winder are disclosed. The systems and methods include scanning a region proximate a winding module with one or more sensors to determine a product defect. The product defect is then associated with a winding process parameter, such as percent roll build information or the identity of the particular sensor to first detect the defect. The winding process parameter is used to classify the defect into one or more defect profiles. The defect profiles can be based at least in part on segmenting the roll build of a web onto a winding module into a plurality of inspection windows and segmenting a plurality of sensors into a plurality of inspection sensor segments.


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