The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Jun. 24, 2015
Gii Acquisition, Llc, Davisburg, MI (US);
Nathan Andrew-Paul Kujacznski, Flint, MI (US);
James W. St. Onge, Bloomfield Hills, MI (US);
Michael G. Nygaard, Fenton, MI (US);
GII Acquisition, LLC, Davisburg, MI (US);
Abstract
A high-speed method and system for inspecting a stream of parts at a pair of inspection stations and sorting the inspected parts is provided. The method includes directing a first array of angularly-spaced beams of collimated radiation at an outer peripheral surface of the part from a first side of a travel path when the part is located at a first inspection station to create a corresponding first array of unobstructed portions of the beams passing by and not blocked by the part. The method also includes directing a second array of angularly-spaced beams of collimated radiation at the outer peripheral surface of the part from a second side of the path when the part is located at a second inspection station to create a corresponding second array of unobstructed portions of the beams passing by and not blocked by the part.