The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Nov. 20, 2014
Applicants:

General Electric Company, Schenectady, NY (US);

The University of Notre Dame Du Lac, Notre Dame, IN (US);

Inventors:

Guangzhi Cao, Madison, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Jean-Baptiste Thibault, Brookfield, WI (US);

Jiahua Fan, New Berlin, WI (US);

Ken D. Sauer, South Bend, IN (US);

Assignees:

General Electric Company, Schenectady, NY (US);

The University of Notre Dame du Lac, Notre Dame, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01); A61B 6/02 (2006.01); A61B 6/03 (2006.01); A61B 6/04 (2006.01); G06T 11/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5276 (2013.01); A61B 6/027 (2013.01); A61B 6/032 (2013.01); A61B 6/0407 (2013.01); G06T 7/0012 (2013.01); G06T 11/003 (2013.01); G06T 2207/10081 (2013.01);
Abstract

Various methods and systems are provided for estimating and compensating for table deflection in reconstructed images. In one embodiment, a method for computed tomography (CT) imaging comprises reconstructing images from data acquired during a helical CT scan where table deflection parameters are estimated and the reconstruction is adjusted based on the table deflection parameters. In this way, images may be reconstructed without artifacts caused by table deflection.


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