The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Jan. 05, 2012
Visit Thaveeprungsriporn, Synapse, SG;
Md. Irwan Bin Md. Kassim, Synapse, SG;
Visit Thaveeprungsriporn, Synapse, SG;
Md. Irwan bin Md. Kassim, Synapse, SG;
Nitto Denko Corporation, Osaka, JP;
Abstract
A reflectance-based optical measurement device and a method for a reflectance-based optical measurement are provided. The device comprises an illumination and detection assembly configured to output light to a surface portion of a user for measurement and to detect the output light reflected from said surface portion of the user as a signal; a coupling member configured for coupling in a cableless configuration to a personal mobile processing device; a measurement surface configured to allow access to said measurement surface by the surface portion of the user; wherein said access is provided by the optical device being holderless such that the surface portion of the user is allowed access to said measurement surface from all directions in a single plane; and further wherein said coupling member is arranged to transmit the detected signal to the personal mobile processing device.