The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Dec. 26, 2013
Applicants:

Fundacio Institut DE Ciencies Fotoniques, Castelldefels, Barcelona, ES;

Washington University, St. Louis, MO (US);

Inventors:

Turgut Durduran, Barcelona, ES;

Claudia Valdes, Barcelona, ES;

Anna Kristoffersen, Barcelona, ES;

Hari M. Varma, Barcelona, ES;

Joseph Culver, St. Louis, MO (US);

Assignees:

FUNDACIO INSTITUT DE CIENCIES FOTONIQUES, Castelldefels, Barcelona, ES;

WASHINGTON UNIVERSITY, St. Louis, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01); A61B 5/026 (2006.01); G01B 9/02 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0261 (2013.01); A61B 5/0062 (2013.01); A61B 5/0073 (2013.01); G01B 9/02094 (2013.01); A61B 5/0066 (2013.01); A61B 5/7203 (2013.01);
Abstract

Speckle contrast optical tomography system provided with at least one point source and multiple detectors, means for providing different source positions, the point source having a coherence length of at least the source position-detector distance and means for arranging the source position-detector pairs over a sample to be inspected, the system being further provided with means for measuring the speckle contrast; the speckle contrast system of the invention thus capable of obtaining 3D images.


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