The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Mar. 07, 2012
Kenji Muto, Fujisawa, JP;
Kenji Muto, Fujisawa, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
In an OCT device, even if an alignment according to a pupil center and a position where a tomographic image can be photographed at a good position may be different according to a subject, automatic alignment is continued at a position where an image quality is good. In a fundus inspection apparatus, an initial adjustment target position on an obtained anterior ocular segment image and an optical axis of a measurement optical system are coincided with each other, and then initial position adjustment is performed. When an instruction for moving an initial adjustment target position is issued, the measurement optical system is moved by a moving amount corresponding to the instruction. At the same time, the initial adjustment target position on the anterior ocular segment image is changed to a position after the movement of the measurement optical system, and positional adjustment is performed again.