The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Jun. 09, 2014
Carl Zeiss Meditec Ag, Jena, DE;
CARL ZEISS MEDITEC AG, Jena, DE;
Abstract
An ophthalmology microscopy system for observing fluorescence comprises an imaging system and an illumination system. The imaging system provides at least one optical imaging path producing a magnified multi-dimensional image of an object disposable in a focal plane of the imaging system, and comprises at least one optical observation filter. The illumination system provides an illumination beam path intersecting the focal plane of the imaging system at a variable angle of less than 90°. The microscopy system comprises first and second operating states. In the first operating state, radiation passing through the illumination beam path has at least in a section along the illumination beam path a spectrum free of a pass band of the observation filter. In the second operating state, radiation passing through the illumination beam path has a spectrum having a bandwidth of at least 200 nm in a range from 380 nm to 780 nm.