The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Nov. 03, 2014
Denso International America, Inc., Southfield, MI (US);
Christopher Adams, Maryville, TN (US);
Denso International America, Inc., Southfield, MI (US);
Abstract
A quality test device tests a display device having a plurality of thin film transistors (TFTs). The quality test device includes a color analyzer for determining a color of an image displayed by the display device, and a quality inspection module. The quality inspection module controls a display state of the display device and determines whether the TFTs are adequately disposed within the display device based on a performance threshold. The quality inspection module determines that the display device is defective when a performance data of the display device is outside of the performance threshold, and determines that the display device is normal when the performance data is within the performance threshold.