The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Jan. 22, 2013
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Jason Howard Messinger, Andover, MA (US);

Sekhar Soorianarayanan, Bangalore, IN;

Charles Burton Theurer, Alplaus, NY (US);

Michael Christopher Domke, Skaneateles, NY (US);

Robert Carroll Ward, Essex, CT (US);

Scott Leo Sbihli, Lexington, MA (US);

Thomas Eldred Lambdin, Auburn, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 29/06 (2006.01); H04W 4/00 (2009.01); H04L 29/08 (2006.01); H04W 4/18 (2009.01);
U.S. Cl.
CPC ...
H04L 65/403 (2013.01); H04L 67/12 (2013.01); H04W 4/006 (2013.01); H04W 4/18 (2013.01);
Abstract

A method for sharing data in a non-destructive testing (NDT) system may include receiving, using a microprocessor, an indication of data to be shared such that the data has been acquired using one or more non-destructive testing (NDT) inspection devices. The method may also include receiving a format in which to send the data, receiving one or more recipients designated to receive the data to be shared; and automatically modifying the data into the format and sending the modified data to the recipients once the data has been acquired by the NDT inspection devices.


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