The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Jul. 10, 2015
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventors:

Daniel P. Timm, Colorado Springs, CO (US);

Steven J. Pelelo, Colorado Springs, CO (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03D 1/24 (2006.01); H04L 27/06 (2006.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04L 27/06 (2013.01); H04L 27/2695 (2013.01);
Abstract

A measurement apparatus, for example a digital oscilloscope, receives an amplitude modulated (AM) signal comprising a baseband signal, having a baseband waveform, modulating a carrier signal, and reconstructs the baseband waveform. The measurement apparatus: samples the AM signal at a sampling rate which produces a plurality of data samples for each period of the carrier signal; determines the amplitude of the baseband signal for each of a plurality of periods of the carrier signal from at least some of the plurality of data samples for each period; and reconstructs the baseband waveform from the amplitudes of the baseband signal for each of the plurality of periods of the carrier signal. The measurement apparatus may display the reconstructed baseband waveform on a display device.


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