The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Oct. 21, 2014
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Jungwon Lee, San Diego, CA (US);
Yingqun Yu, San Diego, CA (US);
Sungsoo Kim, Seoul, KR;
CheolHee Park, San Diego, CA (US);
Samsung Electronics Co., Ltd, , KR;
Abstract
Methods, apparatuses, and systems for improved channel estimation in an Orthogonal Frequency Division Multiplexing (OFDM) system are discussed. In one example discussed herein, joint two-dimensional Minimum Mean-Square Error (2D-MMSE) channel estimation is performed on any Resource Element (REs) containing a reference signal in a Resource Block (RB), one-dimensional Minimum Mean-Square Error (1D-MMSE) channel estimation is performed in the frequency domain on each OFDM symbol in the RB, and then channel estimation is performed in the time domain on each frequency sub-carrier in the RB. In another example discussed herein, Power Delay Profiles (PDPs) and/or frequency correlations are calculated using minimax optimization and then stored in a Look-Up Table (LUT) indexed by estimated Signal to Noise Ratio (SNR) and the estimated maximum delay spread. A portable device could use such an LUT in MMSE calculations.