The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Sep. 16, 2015
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Norikazu Osada, Meguro, JP;

Takashi Kuboki, Ota, JP;

Shinsuke Matsuno, Minato, JP;

Assignee:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 4/131 (2010.01); H01M 4/133 (2010.01); H01M 4/134 (2010.01); H01M 4/36 (2006.01); H01M 4/38 (2006.01); H01M 4/485 (2010.01); H01M 4/587 (2010.01); H01M 4/13 (2010.01); H01M 4/48 (2010.01); H01M 4/62 (2006.01); H01M 10/0525 (2010.01); H01M 4/02 (2006.01);
U.S. Cl.
CPC ...
H01M 4/364 (2013.01); H01M 4/13 (2013.01); H01M 4/386 (2013.01); H01M 4/483 (2013.01); H01M 4/587 (2013.01); H01M 4/625 (2013.01); H01M 10/0525 (2013.01); H01M 2004/021 (2013.01);
Abstract

A negative electrode for a nonaqueous electrolyte secondary battery of the embodiment includes a current collector; and an electrode mixture layer that is formed on the current collector and contains a first particle, a second particle and a binder. The first particle is comprised of silicon, a silicon oxide and a carbonaceous material. The second particle has electron conductivity and an oxygen content of 1% or lower. The electrode mixture layer is characterized in that silicon concentrations in the vicinity of the surface having contact with the current collector and the vicinity of the opposite surface to the surface having contact with the current collector are higher than a silicon concentration at the central part in the thickness direction.


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