The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Feb. 16, 2011
Masahiro Ikegami, Takaishi, JP;
Takahiro Harada, Kizugawa, JP;
Masahiro Ikegami, Takaishi, JP;
Takahiro Harada, Kizugawa, JP;
SHIMADZU CORPORATION, Kyoto-shi, JP;
Abstract
When a sample plateis set on a sample stage, an irradiation trace formation controllerappropriately moves the sample stageand throws a short pulse of high-power laser beam to create an irradiation trace at a predetermined position on the sample plate. The irradiation trace has a unique shape. A microscopic image of the irradiation trace is captured and saved in an image storage section. After the sample plateis temporarily removed from the stageto apply a matrix to a sample, the sample plateis re-set on the same stage. Then, the displacement of the sample platefrom its original position is calculated from the difference in the position of the irradiation trace between an image taken at that point in time and the image previously stored in the image storage section. Based on the calculated result, an analysis position correctormodifies the position information of an area selected by an operator. Thus, the displacement of the re-set sample plate can be accurately detected. There is no need to use a special sample plate previously processed for creating a marker for displacement detection.