The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Aug. 28, 2012
Songxian Wen, Shenzhen, CN;
Jungmao Tsai, Shenzhen, CN;
Shiue-shih Liao, Shenzhen, CN;
Yizhuang Zhuang, Shenzhen, CN;
Mingfeng Deng, Shenzhen, CN;
Songxian Wen, Shenzhen, CN;
Jungmao Tsai, Shenzhen, CN;
Shiue-shih Liao, Shenzhen, CN;
Yizhuang Zhuang, Shenzhen, CN;
Mingfeng Deng, Shenzhen, CN;
SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD., Shenzhen, CN;
Abstract
The present invention provides a testing device and a testing method. The testing method comprises: providing a testing device; bonding at least one connecting terminal of the testing device to signal lines of the display panel; and inputting test signals to the signal lines of the display panel through at least one test contact of the testing device. In the present invention, it is not required to arrange shorting bars on the display panel.