The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Jun. 13, 2013
Amazon Technologies, Inc., Reno, NV (US);
Connor Spencer Blue Worley, San Diego, CA (US);
Devin Bertrum Pauley, Mountain View, CA (US);
Amazon Technologies, Inc., Reno, NV (US);
Abstract
Described are methods and systems of processing three-dimensional ('3D') data by generating an edge map, a depth map, or both. Data points are placed into a bin array based their respective image coordinates. The data points in each bin are processed to determine edge data. An edge map may be generated from this edge data. A bin value may be generated based on the data points in each bin, and a depth map generated using these bin values. The edge data and the edge map may be processed using one or more filter functions. Measurements based on the edge map may be provided at a resolution greater than that available with the depth map.