The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
May. 16, 2011
Cha Zhang, Sammamish, WA (US);
Wenwu Zhu, Basking Ridge, NJ (US);
Zhengyou Zhang, Bellevue, WA (US);
Philip A. Chou, Bellevue, WA (US);
Cha Zhang, Sammamish, WA (US);
Wenwu Zhu, Basking Ridge, NJ (US);
Zhengyou Zhang, Bellevue, WA (US);
Philip A. Chou, Bellevue, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A depth construction module is described that receives depth images provided by two or more depth capture units. Each depth capture unit generates its depth image using a structured light technique, that is, by projecting a pattern onto an object and receiving a captured image in response thereto. The depth construction module then identifies at least one deficient portion in at least one depth image that has been received, which may be attributed to overlapping projected patterns that impinge the object. The depth construction module then uses a multi-view reconstruction technique, such as a plane sweeping technique, to supply depth information for the deficient portion. In another mode, a multi-view reconstruction technique can be used to produce an entire depth scene based on captured images received from the depth capture units, that is, without first identifying deficient portions in the depth images.