The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Dec. 09, 2013
Applicant:
Verint Systems Ltd., Herzilya Pituach, IL;
Inventors:
Yaron Ostrovsky-Berman, Petach Tikva, IL;
Ran Gur, Kiryat Ono, IL;
Nir Naor, Ramat Hasharon, IL;
Ran Wronsky, Rison LeZion, IL;
Michael Milman, Kiryat Ono, IL;
Assignee:
VERINT SYSTEMS LTD., Herzilya Pituach, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06Q 10/10 (2012.01);
U.S. Cl.
CPC ...
G06T 7/004 (2013.01); G06Q 10/10 (2013.01);
Abstract
Systems and methods of detecting irregular events include the extraction of values for measure in each of a plurality of notifications. The extracted values are stored in a measures database and a distribution is calculated for the values of each of the measures. The extracted values are compared to the calculated distributions to determine if an irregular event has occurred. An irregularity alert is produced if an irregular event has occurred.