The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Mar. 14, 2014
Ato Araki, Ota, JP;
Tadashi Kitai, Zama, JP;
Ato Araki, Ota, JP;
Tadashi Kitai, Zama, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An image inspection apparatus for inspecting an image output on a recording medium. The image inspection apparatus includes processing circuitry that obtains data of an output-target image used by an image forming apparatus to conduct an image forming operation, generates read data from the data of the output-target image, and generates an inspection reference image from the data of the output-target image. The apparatus also performs position alignment between the read image and the inspection reference image, conducts an inspection which determines a defect in the read image based on the difference of the aligned read image and the inspection reference image, and determines whether a position alignment defect exists in the read image based on the defect detected during inspection.