The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
May. 15, 2012
Applicants:
Ajay Raghavan, Mountain View, CA (US);
Juan Liu, Cupertino, CA (US);
Robert R. Price, Palo Alto, CA (US);
Inventors:
Ajay Raghavan, Mountain View, CA (US);
Juan Liu, Cupertino, CA (US);
Robert R. Price, Palo Alto, CA (US);
Assignee:
Palo Alto Research Center, Incorporated, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); H04N 5/235 (2006.01); H04N 5/225 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/325 (2013.01); H04N 5/2354 (2013.01); G06K 2209/15 (2013.01); H04N 5/2256 (2013.01); H04N 17/002 (2013.01);
Abstract
A method () is provided for characterizing a functionality of a flash () from at least one image () captured with a camera () using the flash (). The method () includes: analyzing the image () by segmenting () the image () into at least one sub-region (), and applying a metric () to the sub-region () to measure an image property within the sub-region (); and determining () the functionality of the flash () in response to a result of the applied metric.