The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Dec. 19, 2011
Applicants:

Joong Lee, Seoul, KR;

Tae-yi Kang, Seoul, KR;

Jun Seok Byun, Gyeonggi-do, KR;

Inventors:

Joong Lee, Seoul, KR;

Tae-Yi Kang, Seoul, KR;

Jun Seok Byun, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/20 (2006.01); A63F 1/18 (2006.01); A63F 9/06 (2006.01); A63F 9/24 (2006.01);
U.S. Cl.
CPC ...
G06K 9/2063 (2013.01); A63F 1/18 (2013.01); A63F 2009/063 (2013.01); A63F 2009/2444 (2013.01); A63F 2250/58 (2013.01);
Abstract

The present invention relates to a method for detecting a mark that is invisible in the visible light region. Here, the invisible mark is displayed on a card using a characteristic according to which the color of light is changed by means of a refractive index difference according to media in the visible light region. According to the method for detecting the invisible mark, it may be quickly determined whether the card is a counterfeit card in an investigation. In addition, since it is unnecessary to repeatedly inspect the card to be checked using various wavelengths, the time required for determining whether the card is a counterfeit card may be reduced.


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