The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Mar. 12, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Yedidya Dotan, Newton, MA (US);

Oded Peer, Ranana, IL;

Oleg Freylafert, Hod Hasharon, IL;

Asaf Shoval, Rishon Le-Zion, IL;

Eyal Lewinsohn, Hopkinton, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30469 (2013.01);
Abstract

Methods, apparatus and articles of manufacture for modifying queries and rules for profile fetching and risk calculation are provided herein. A method includes comparing at least one aspect of a query submitted to access a data store to rule sets associated with the data store to determine a potential access path within the data store for responding to the query, comparing information pertaining to an entity identified via the query to risk information pertaining to entities to determine a level of risk associated with the entity identified via the query, generating a modified version of the query based on information derived from the potential access path within the data store for responding to the query, and calculating a risk score associated with the modified version of the query based on the aspect of the query and the level of risk associated with the entity identified via the query.


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