The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Oct. 16, 2012
Microsoft, Redmond, WA (US);
Janani Vasudevan, Redmond, WA (US);
Andrew Precious, Seattle, WA (US);
Firoz Dalal, Sammamish, WA (US);
Herman Widjaja, Seattle, WA (US);
Jarred Bonaparte, Seattle, WA (US);
Todd Frost, Woodinville, WA (US);
Ryan Segeberg, Covington, WA (US);
Rajkumar Mohanram, Redmond, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Test cases are executed by the software engineering test system. The test cases target software products. Test outputs are generated indicating whether the software engineering test system determined the test cases to have passed or failed. Separately, bug records are stored in a first dataset whose records identify corresponding bugs. Records of the test case executions are stored in a second dataset. Records thereof indicate whether a corresponding test case failed when executed. Such records may have bug identifiers entered by a test engineer and corresponding to bugs identified by the test engineer. The first dataset is parsed to identify records of test runs that have failed, and for each such test run record a bug identifier thereof is identified. Statistics such as failure counts are updated for the bugs found in the test run records.