The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Mar. 23, 2015
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Nipun Arora, Plainsboro, NJ (US);

Junghwan Rhee, Princeton, NJ (US);

Hui Zhang, Princeton Junction, NJ (US);

Guofei Jiang, Princeton, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3466 (2013.01);
Abstract

The present invention enables capturing API level calls using a combination of dynamic instrumentation and library overriding. The invention allows event level tracing of API function calls and returns, and is able to generate an execution trace. The instrumentation is lightweight and relies on dynamic library/shared library linking mechanisms in most operating systems. Hence we need no source code modification or binary injection. The tool can be used to capture parameter values, and return values, which can be used to correlate traces across API function calls to generate transaction flow logic.


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