The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Jan. 22, 2013
General Electric Company, Schenectady, NY (US);
Sekhar Soorianarayanan, Bangalore, IN;
Michael Christopher Domke, Skaneateles, NY (US);
Jason Howard Messinger, Andover, MA (US);
Thomas Eldred Lambdin, Auburn, NY (US);
Charles Burton Theurer, Alplaus, NY (US);
Robert Carroll Ward, Essex, CT (US);
Susan Montagna, Newtown Square, PA (US);
Scott Leo Sbihli, Lexington, MA (US);
General Electric Company, Schenectady, NY (US);
Abstract
A collaboration system may include a first computing device that may communicate with at least one other computing device via a computing network. The computing network may communicatively couple to a number of computing devices and the first computing device may receive inspection data acquired by one or more non-destructive testing (NDT) devices. After receiving the inspection data, the first computing device may determine at least one of a workflow for analyzing the inspection data based on the inspection data, a layout configured to display the inspection data, or a set of tools configured to analyze the inspection data. The first computing device may then implement the workflow, display the inspection data according to the layout, and/or display the set of tools. The workflow may include one or more processes that may be used to analyze the inspection data.