The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Jul. 25, 2014
Emc Corporation, Hopkinton, MA (US);
Ao Ma, Palo Alto, CA (US);
Surendar Chandra, Sunnyvale, CA (US);
Frederick Douglis, Basking Ridge, NJ (US);
Guanlin Lu, San Jose, CA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
Techniques for determining vulnerability of disks are described herein. According to one embodiment, for each of a plurality of disks representing a redundant array of independent disks (RAID), a reallocated sector count associated with the disk is obtained, the reallocated sector count representing a number of sectors that have been reallocated due to an error of a storage transaction to the disk. A failure probability of the disk given the obtained reallocated sector count is determined using a predictive model, wherein the predictive model was generated based on history operating data of a set of known disks. Thereafter, a failure probability of at least two of the disks in the RAID is determined based on the failure probability of each of the disks to determine vulnerability of the RAID.